Ability to detect the extreme outer surface along surface vector for Nominal Point Creation when assy has multiple overlay surfaces in order to build nominals for section slices as found in Blade Nominal File creattion.

Currently PC-DMIS does not have a way for a CWLS system to calibrate the offset within the probe utilities edit window. You can construct the probe but for calibration it requires a completely separate process. This would be for a Vision primary system with TTP & CWLS probe capabilities.

Currently I have 3 different CWLS lenses and 3 different Vision lenses.

In order to calibrate the offset between each possible configuration of lenses requires me to program a separate calibration routine for each configuration and then uses manually coded scripting to update the PRB.BAS file.

This would be a great thing to add.

This once seems simple but I have yet to find a work around. I am trying to extract data points from MANY scan sets and utilize paste with pattern to do so.

Unfortunately when trying to use this, paste with pattern will auto index everything EXCEPT the bold area, it will stay at SCN1 instead of 1, 2, 3 ect. like everything around it. Not sure why, and I am not sure if there is a way around it, if paste with pattern is not capable to do this I think it should be.

Thanks!

ASSIGN/HITN = MAXINDEX(SCN1.HIT[1..SCN1.NUMHITS].X)

ASSIGN/HITN = MAXINDEX(SCN1.HIT[1..SCN1.NUMHITS].X) 
ASSIGN/MAXVAL = SCN1.HIT[HITN].X

F1 =GENERIC/POINT,DEPENDENT,RECT,$
NOM/XYZ,SCN1.HIT[HITN].TX,SCN1.HIT[HITN].TY,SCN1.HIT[HITN].TZ,$
MEAS/XYZ,SCN1.HIT[HITN].X,SCN1.HIT[HITN].Y,SCN1.HIT[HITN].Z,$
NOM/IJK,0,0,1,$
MEAS/IJK,0,0,1

Currently the way PC-DMIS is if you are using a Precitec type controller for a CWLS system in order to correct the range on the controller for the current lens of use you have to go in EGON Configuration editor (which you should not do unless you really know what you are doing! but I had to) to change the WLS Lens selection.

There is no option to change this within the laser parameters while coding or anywhere in PC-DMIS. This is currently solely controlled by hard code from the configuration. I have 3 different white light sensor lens and in order to change out one to another I have to open EGON every time.

Please add a Forum section for Chromatic White Light Sensor Scanning or laser scanning to share discussions upon using a third probe setup on machines. This would be a huge imporvement.

I cannot find anny topics or discussions on this topic it is fairly new and would be a great addition.

I wish I could insert created views in legacy report. Now I can only recall views and make a screenshot of screen and this is not automated. Creation of complete legacy report take too much time but creating views is simple and faster. Legacy report is saved as PDF document.

Extend Summary mode as more than just a tree view that requires expanding. Make several of the most common features easily accessible (i.e. hits on a circle with +/- buttons, check box for find hole routine in circles, show the features used in an alignment, etc.)

lntroduce self learning packages where a new beginner can learn at home on a simulated software. Step by step training with a library of models from manual alignment to advance features.

Just like MASTERCAM which has excellent training package

a quicker more accessible option for reporting

We would like to be able to pattern around a specified feature as oppose to having to move the datum to that location, as pattern only operates around the datum.