+1

Pattern Feature

Graham_Sam منذ 8 سنة في Metrology Software / PC-DMIS تم التحديث من قبل neil kay منذ 4 سنة 1

We would like to be able to pattern around a specified feature as oppose to having to move the datum to that location, as pattern only operates around the datum.

This is a good idea, Graham, that we also heard from the recent UK SMA Days. Thanks for filing. Let's see who else would find this useful.

خدمة دعم العملاء من خلال UserEcho