+1

Pattern Feature

Graham_Sam 8 jaar geleden in Metrology Software / PC-DMIS bijgewerkt door neil kay 4 jaar geleden 1

We would like to be able to pattern around a specified feature as oppose to having to move the datum to that location, as pattern only operates around the datum.

This is a good idea, Graham, that we also heard from the recent UK SMA Days. Thanks for filing. Let's see who else would find this useful.