1. Hexagon Measurement Systems
  2. Metrology Software
  3. PC-DMIS
  4. Идеи
+1

Pattern Feature

Graham_Sam 8 лет назад в Metrology Software / PC-DMIS • обновлен neil kay 4 года назад • 1

We would like to be able to pattern around a specified feature as oppose to having to move the datum to that location, as pattern only operates around the datum.

neil kay 8 лет назад

This is a good idea, Graham, that we also heard from the recent UK SMA Days. Thanks for filing. Let's see who else would find this useful.

Сервис поддержки клиентов работает на платформе UserEcho