1. Hexagon Measurement Systems
  2. Metrology Software
  3. PC-DMIS
  4. Ideen
+1

Pattern Feature

Graham_Sam vor 8 Jahren in Metrology Software / PC-DMIS • aktualisiert von neil kay vor 4 Jahren • 1

We would like to be able to pattern around a specified feature as oppose to having to move the datum to that location, as pattern only operates around the datum.

neil kay vor 8 Jahren

This is a good idea, Graham, that we also heard from the recent UK SMA Days. Thanks for filing. Let's see who else would find this useful.

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